OTHER EQUIPMENT
OTHER EQUIPMENT

AFM MULTIMODE NANOSCOPE III A (BRUKER)

LEICA DCM3D

AFM Dimension 3100

AFM Asylum MFP3D

AFM Multimode 8 Nanoscope III

AFM Multimode8 Nanoscope V

JEOL JXA 8230

FESEM JSM 7100 F with EDS

JSM 6510

ESEM-VPSEM Quanta 200

JSM 7001F

Sample preparation laboratory Cryo

Sample preparation laboratory TEM MAT

Jeol EM J1010

FEI Tecnai G2 Spirit TWIN

Tecnai G2 F20 TWIN

TEM JEM 1010

JEM 2010F

Nova NanoSEM 450

JEM 2100

Veeco-Bruker Multimode 8 AFM

AAHRUS VT-SPM

OMICRON LTQPLUS

ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE: SEM-QUANTA FEG-250 (ESEM)

FIELD EMISSION SCANNING ELECTRON MICROSCOPE CSEM-FEG INSPECT 50

SUPERPROBE JXA-8900 M

JSM 6335F

JSM 7600F

JSM 6400

JEM 2100HT

JEM-1400

JEM-3000F

JEM 1010

TEM SAMPLE PREPARATION SERVICE – LMA

TECNAI F30
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