OTHER EQUIPMENT
OTHER EQUIPMENT
SCIOS2
AFM MULTIMODE NANOSCOPE III A (BRUKER)
LEICA DCM3D
AFM Dimension 3100
AFM Asylum MFP3D
AFM Multimode 8 Nanoscope III
AFM Multimode8 Nanoscope V
JEOL JXA 8230
FESEM JSM 7100 F with EDS
JSM 6510
ESEM-VPSEM Quanta 200
JSM 7001F
Sample preparation laboratory Cryo
Sample preparation laboratory TEM MAT
Jeol EM J1010
FEI Tecnai G2 Spirit TWIN
Tecnai G2 F20 TWIN
TEM JEM 1010
JEM 2010F
JEM ARM200CF: WITH CORRECTED ABERRATION IN CONDENSED LENS
JEM ARM300CFEG: WITH CORRECTED ABERRATION IN OBJECTIVE LENS
Image Corrected Titan
Nova NanoSEM 450
TALOS F200X
JEM 2100
ANALYTICAL TITAN
TITAN3 THEMIS 60-300
DUAL BEAM: HELIOS NANOLAB 600 & 650
CRYOGENIC DUAL BEAM NOVA 200
SPECS JT – STM
Veeco-Bruker Multimode 8 AFM
AAHRUS VT-SPM
OMICRON LTQPLUS
ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE: SEM-QUANTA FEG-250 (ESEM)
FIELD EMISSION SCANNING ELECTRON MICROSCOPE CSEM-FEG INSPECT 50
SUPERPROBE JXA-8900 M
JSM 6335F
JSM 7600F
JSM 6400
JEM 2100HT
JEM-1400
JEM-3000F
JEM 1010
TEM SAMPLE PREPARATION SERVICE – LMA
TECNAI F30
CONTACT US
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