Nano-Observer

Nano-Observer

Nano-Observer Scanning Probe Microscopies are key enabling techniques in Nanoscience and Nanotechnology, supporting a wide range of multidisciplinary activities. The LMA hosts various multipurpose AFM/STM heads that cover a broad range of applications under near...
NEOARM 30-200kV cFEG

NEOARM 30-200kV cFEG

Electron Microscope JEM ARM200cF The JEOL JEM ARM200cF located at the National Centre for Electron Microscopy (CNME) is unique in Spain. This microscope features make it particularly suitable to study structural, chemical and electronic properties of materials at...
SCIOS2

SCIOS2

High throughput Dual Beam (Ar+ ions and electrons) FIB-FEGSEM station for SEM characterization of materials and life-science samples (including secondary, backscattered and STEM imaging; XEDS microanalysis and EBSD), TEM/STEM sample preparation from bulk...
LEICA DCM3D

LEICA DCM3D

LEICA DCM3D-confocal/Interferometric The Leica DCM 3D system with dual core technology has been designed for fast, non-invasive assessment of micro and nano structures of technical surfaces, in multiple configurations. The DCM 3D combines confocal and interferometry...
AFM Dimension 3100

AFM Dimension 3100

AFM Dimension 3100 The performance and reliability of the MultiMode platform is the result of both its superior mechanical design and the industry’s lowest noise control electronics. The MultiMode 8 AFM is equally well suited for imaging in both air and fluid...
AFM Asylum MFP3D

AFM Asylum MFP3D

AFM Asylum MFP3D The MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements.   USES OF THE EQUIPMENT Contact Mode: Imaging using feedback on...