ELECMI

Top level infraestructures in Electron Microscopy for the observation, characterization and handling of materials at atomic scale

TITAN3 THEMIS 60-300

DME, Cádiz

JEM ARM300CFEG: WITH CORRECTED ABERRATION IN OBJECTIVE LENS

CNME, Madrid

ANALYTIC TITAN&TITAN CUBE

LMA, Zaragoza

PRECESSION ELECTRON DIFFRACTION

UMEAP, Barcelona

OTHER TECHNIQUES, DRX Microprobe FESEM

UMEAP, Barcelona

DUAL BEAM: HELIOS NANOLAB 600 & 650

LMA, Zaragoza

TITAN CUBE & JEM ARM200CF

LMA & CNME

SCANNING ELECTRON MICROSCOPY

LMA, CNME, DME & UMEAP

XPS KRATOS ULTRA

LMA, Zaragoza

TITAN3 THEMIS 60-300

DME, Cádiz

Fourth ELECMI webinar 2021

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Third ELECMI webinars 2021

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Second ELECMI webinars 2021

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First ELECMI webinars 2021

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Fourth ELECMI webinar 2021

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Third ELECMI webinars 2021

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Second ELECMI webinars 2021

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First ELECMI webinars 2021

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INTEGRATED INFRASTRUCTURE FOR ELECTRON MICROSCOPY OF MATERIALS

At ELECMI we are experts in Electron Microscopy. Our state-of-the-art equipment is available both for researchers and industry, and we support its use by offering advice and consultancy for the analysis, characterization of materials and development of new products. Together, we boost technology transfer and innovation.

We are a Singular Scientific Technical Infrastructure (ICTS) in the current ICTS map of the Spanish State. ELECMI is made up of four nodes: the CNME (National Center for Electronic Microscopy) of the Complutense University of Madrid; the LMA (Laboratory for Advanced Microscopies) of the University of Zaragoza; the DME (Division of Electronic Microscopy) of the University of Cádiz and the UMEAP (Unit of Electronic Microscopy Applied to Materials) of the University of Barcelona.

ELECMI NODES

ELECMI’S ORGANIZATIONAL STRUCTURE

Currently managerial positions

President: Prof. Pilar Cea (LMA)

Coordinator: Prof. José María de Teresa Nogueras (LMA)

Coordination Committee

LMA: Pilar Cea Mingueza and José María de Teresa Nogueras

UCM: José Mª González Calbet and Juan Garvín Maeso

UCA: José Juan Calvino Gámez and Ginesa Blanco Montilla

UB: Francesca Peiró y Juan Fran Sangüesa Ferrer

Coordinators of the Access Committee

LMA: César Magén

UCM: Javier García

UCA: Susana Trasobares Llorente

UB: Joan Mendoza

CNME – National Center for Electronic Microscopy

The National Center for Electronic Microscopy (CNME) is the main Transversal action of the Moncloa Campus of International Excellence. It is designed, in accordance with the study carried out by the FECYT on ICTS, to develop, implement and offer to the national and international scientific community the most advanced methods and techniques in transmission and scanning electron microscopy for the structural analysis of materials. This Center consists of a series of latest generation microscopes, instruments and techniques for advanced sample preparation. Computational imaging methods are also available..

LMA – Advanced Microscopy Laboratory

The Advanced Microscopy Laboratory, LMA, is integrated into the Río Ebro campus of Zaragoza University. It’s a unique initiative at national and international levels aimed at providing the Industrial and Scientific communities with the most advanced infrastructures in Nanofabrication, Local Probe and Electron Microscopies for the observation, characterization, nanopatterning and handling of materials at atomic and molecular scale.

DME ELECMI – Division of Electron Microscopy

The Electron Microscopy Division, DME, is integrated into the Central Services of Science and Technology (SC-ICYT) of Cádiz University. The infrastructure has a staff of technical personnel highly specialized in techniques such as microscopy of corrected aberrations (TEM, STEM), electron tomography and electron loss spectroscopy (EELS) and Dispersive X-ray energy (EDX). The main DME-UCA priorities are education, training and dissemination of innovative techniques and methods based on transmission electron microscopy and electron microscopy applicability to materials applied research.

UMEAP ELECMI – Electron Microscopy Unit Applied to Materials

The Unit of Electron Microscopy Applied to Materials (UMEAP-UB) is integrated in the Scientific and Technological Centers of the University of Barcelona (CCITUB). It has highly specialized personnel in transmission electron microscopy characterization techniques and related analytical techniques (EELS and EDXS spectroscopy), as well as advanced data processing and simulation. They have beam precession systems (for 3D electronic diffraction, electronic crystallography, recognition of crystalline phases and orientation and tension maps) and specific specimen holders for in-situ microscopy and electron tomography. They also offer TEM and SEM microscopy techniques for biological material (Cryo-Tomography, In-Situ Hybridization, etc.), and a wide selection of complementary characterization techniques, such as microprobes, X-ray diffractometers, Raman microscopy, ESCA, AFM, etc.

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