by Elecmi | Jun 7, 2022 | DME Cádiz, EQUIPMENTS, Unique Equipment, SEM & DUAL BEAM
High throughput Dual Beam (Ar+ ions and electrons) FIB-FEGSEM station for SEM characterization of materials and life-science samples (including secondary, backscattered and STEM imaging; XEDS microanalysis and EBSD), TEM/STEM sample preparation from bulk...
by Elecmi | Aug 11, 2020 | Other Equipment, SEM & DUAL BEAM, DME Cádiz, EQUIPMENTS
Nova NanoSEM 450 Nova NanoSEM 450 provides high resolution imaging in scanning mode using different detectors. Equipped with in-column secondary electrons detector (TLD-SE) and beam deceleration, it allows to provide high quality images even at the lowest acceleration...
by Elecmi | Aug 11, 2020 | DME Cádiz, EQUIPMENTS, Unique Equipment, TEM
High throughput TEM/STEM microscope for the structural and compositional analysis of samples at the angstrom resolution level. It can be operated at 200 and 80 kV. Equipped with a high brightness Field Emission Gun (XFEG); high efficiency XEDS system (Super-X G2)...
by Elecmi | Aug 11, 2020 | Unique Equipment, TEM, DME Cádiz, EQUIPMENTS
Double Aberration-Corrected, Monochromated, Transmission (TEM) Scanning Transmission (STEM) Electron Microscope incorporating advanced optical elements to compensate the intrinsic aberrations of both the Objective and Condenser Lenses. Equipped with a High Brightness...
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