by Elecmi | Jun 7, 2022 | DME Cádiz, EQUIPMENTS, Unique Equipment, SEM & DUAL BEAM
High throughput Dual Beam (Ar+ ions and electrons) FIB-FEGSEM station for SEM characterization of materials and life-science samples (including secondary, backscattered and STEM imaging; XEDS microanalysis and EBSD), TEM/STEM sample preparation from bulk...
by Elecmi | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona
JEOL JXA 8230 The electron microprobe (electron probe microanalyzer, EPMA) is an instrument that allows performing quantitative chemical analyses of solid samples at the micrometer scale. With the electron microprobe the concentration of elements from B to U can be...
by Elecmi | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona
FESEM JSM 7100-F with EDS Field Emission Scanning Electron Microscope FESEM JSM 7100 F (JEOL) USES OF THE EQUIPMENT High-resolution high vacuum microscopy Microscopic characterization of materials Qualitative microanalysis of solid materials TECHNICAL...
by Elecmi | Aug 11, 2020 | SEM & DUAL BEAM, UMEAP - Barcelona, EQUIPMENTS, Other Equipment
ESEM-VPSEM Quanta 200 Environmental Scanning Electron Microscope (thermionic) ESEM-VPSEM Quanta 200 (FEI) USES OF THE EQUIPMENT Microscopy in high vacuum and low vacuum Microscopic characterization of materials Qualitative microanalysis of solid materials...
by Elecmi | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona
JSM 7001F The JSM-7001F is a scanning electron microscope that allows the acquisition of high resolution images combining topographical and chemical contrast images, reaching a complete study of a great variety samples. This scanning electron microscope is indicated...
by Elecmi | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, DME Cádiz
Nova NanoSEM 450 Nova NanoSEM 450 provides high resolution imaging in scanning mode using different detectors. Equipped with in-column secondary electrons detector (TLD-SE) and beam deceleration, it allows to provide high quality images even at the lowest acceleration...
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