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JEOL JXA 8230

JEOL JXA 8230

by o10mediaB | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona

JEOL JXA 8230 The electron microprobe (electron probe microanalyzer, EPMA) is an instrument that allows performing quantitative chemical analyses of solid samples at the micrometer scale. With the electron microprobe the concentration of elements from B to U can be...
FESEM JSM 7100 F with EDS

FESEM JSM 7100 F with EDS

by o10mediaB | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona

FESEM JSM 7100-F with EDS Field Emission Scanning Electron Microscope FESEM JSM 7100 F (JEOL)   USES OF THE EQUIPMENT High-resolution high vacuum microscopy Microscopic characterization of materials Qualitative microanalysis of solid materials TECHNICAL...
ESEM-VPSEM Quanta 200

ESEM-VPSEM Quanta 200

by o10mediaB | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona

ESEM-VPSEM Quanta 200 Environmental Scanning Electron Microscope (thermionic) ESEM-VPSEM Quanta 200 (FEI) USES OF THE EQUIPMENT Microscopy in high vacuum and low vacuum Microscopic characterization of materials Qualitative microanalysis of solid materials...
JSM 7001F

JSM 7001F

by o10mediaB | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona

JSM 7001F The JSM-7001F is a scanning electron microscope that allows the acquisition of high resolution images combining topographical and chemical contrast images, reaching a complete study of a great variety samples. This scanning electron microscope is indicated...
Nova NanoSEM 450

Nova NanoSEM 450

by o10mediaB | Aug 11, 2020 | DME Cádiz, EQUIPMENTS, Other Equipment, SEM & DUAL BEAM

Nova NanoSEM 450 Nova NanoSEM 450 provides high resolution imaging in scanning mode using different detectors. Equipped with in-column secondary electrons detector (TLD-SE) and beam deceleration, it allows to provide high quality images even at the lowest acceleration...
ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE: SEM-QUANTA FEG-250 (ESEM)

ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE: SEM-QUANTA FEG-250 (ESEM)

by o10mediaB | Aug 11, 2020 | EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, LMA - Zaragoza

ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE: SEM-QUANTA FEG-250 (ESEM) The Quanta FEG-250 SEM instrument is an environmental Scanning Electron Microscope used for high-resolution imaging and composition analysis by energy-dispersive X-ray microanalysis (EDS). The FEG...
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    At ELECMI we are experts in Electron Microscopy. Our state-of-the-art equipment is available both for researchers and industry, and we support its use by offering advice and consultancy for the analysis, characterization of materials and development of new products. Together, we boost technology transfer and innovation.

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