FESEM JSM 7100 F with EDS

EQUIPMENTS, Other Equipment, SEM & DUAL BEAM, UMEAP - Barcelona

FESEM JSM 7100-F with EDS

Field Emission Scanning Electron Microscope FESEM JSM 7100 F (JEOL)

 

USES OF THE EQUIPMENT

  • High-resolution high vacuum microscopy
  • Microscopic characterization of materials
  • Qualitative microanalysis of solid materials

TECHNICAL SPECIFICATIONS

  • Pentafex-INCA EDS Detector (Oxford Instruments)
  • E-T secondary electron detector (on camera)
  • Backscattered electron detector (on camera)
  • Cathode luminescence spectrometer (MONOCL4 Gatan)