NEOARM 30-200kV cFEG

NEOARM 30-200kV cFEG

by | Dec 13, 2023 | EQUIPMENTS, Unique Equipment, TEM, UMEAP - Barcelona

Electron Microscope JEM ARM200cF The JEOL JEM ARM200cF located at the National Centre for Electron Microscopy (CNME) is unique in Spain. This microscope features make it particularly suitable to study structural, chemical and electronic properties of materials at...
SCIOS2

SCIOS2

by | Jun 7, 2022 | DME Cádiz, EQUIPMENTS, Unique Equipment, SEM & DUAL BEAM

High throughput Dual Beam (Ar+ ions and electrons) FIB-FEGSEM station for SEM characterization of materials and life-science samples (including secondary, backscattered and STEM imaging; XEDS microanalysis and EBSD), TEM/STEM sample preparation from bulk...
Image Corrected Titan

Image Corrected Titan

by | Aug 11, 2020 | EQUIPMENTS, Unique Equipment, TEM, LMA - Zaragoza

IMPORTANT ANNOUNCEMENT Due to upgrade work on the Image Corrected Titan, the microscope will be down from April 12, 2024 onwards, so it will not be available for any analysis or competitive access proposals until further notice. The Image Corrected Titan has a...
TALOS F200X

TALOS F200X

by | Aug 11, 2020 | TEM, DME Cádiz, EQUIPMENTS, Unique Equipment

High throughput TEM/STEM microscope for the structural and compositional analysis of samples at the angstrom resolution level. It can be operated at 200 and 80 kV. Equipped with a high brightness Field Emission Gun (XFEG); high efficiency XEDS system (Super-X G2)...