SCIOS2

SCIOS2

High throughput Dual Beam (Ar+ ions and electrons) FIB-FEGSEM station for SEM characterization of materials and life-science samples (including secondary, backscattered and STEM imaging; XEDS microanalysis and EBSD), TEM/STEM sample preparation from bulk...
Image Corrected Titan

Image Corrected Titan

The Image Corrected Titan has a spherical aberration corrector (CEOS Company) at the objective lens, the lens that forms the image. It is therefore the ideal instrument for ultra-high resolution imaging (HRTEM). This microscope also has a biprism for Electron...
TALOS F200X

TALOS F200X

High throughput TEM/STEM microscope for the structural and compositional analysis of samples at the angstrom resolution level. It can be operated at 200 and 80 kV. Equipped with a high brightness Field Emission Gun (XFEG); high efficiency XEDS system (Super-X G2)...
ANALYTICAL TITAN

ANALYTICAL TITAN

The Analytical Titan has a spherical aberration corrector (CEOS Company) at the condenser lens, the lens that forms the probe. The Analytical Titan has a spherical aberration corrector (CEOS Company) at the condenser lens, the lens that forms the probe. Consequently,...