by o10mediaB | Jun 7, 2022 | DME Cádiz, EQUIPMENTS, Unique Equipment
High throughput Dual Beam (Ar+ ions and electrons) FIB-FEGSEM station for SEM characterization of materials and life-science samples (including secondary, backscattered and STEM imaging; XEDS microanalysis and EBSD), TEM/STEM sample preparation from bulk...
by o10mediaB | Aug 11, 2020 | CNME - Madrid, EQUIPMENTS, Unique Equipment
Electron Microscope JEM ARM200cF The JEOL JEM ARM200cF located at the National Centre for Electron Microscopy (CNME) is unique in Spain. This microscope features make it particularly suitable to study structural, chemical and electronic properties of materials at...
by o10mediaB | Aug 11, 2020 | CNME - Madrid, EQUIPMENTS, Unique Equipment
JEM GRAND ARM 300cF The JEM GRAND ARM 300cF in the Centro Nacional de Microscopía Electrónica, CNME, is unique in Spain. The configuration chosen was aimed towards an electron microscope to be operated in Conventional Transmission Electron Microscopy, CTEM. It is then...
by ELECMI | Aug 11, 2020 | EQUIPMENTS, Unique Equipment, LMA - Zaragoza
The Image Corrected Titan has a spherical aberration corrector (CEOS Company) at the objective lens, the lens that forms the image. It is therefore the ideal instrument for ultra-high resolution imaging (HRTEM). This microscope also has a biprism for Electron...
by o10mediaB | Aug 11, 2020 | DME Cádiz, EQUIPMENTS, Unique Equipment
High throughput TEM/STEM microscope for the structural and compositional analysis of samples at the angstrom resolution level. It can be operated at 200 and 80 kV. Equipped with a high brightness Field Emission Gun (XFEG); high efficiency XEDS system (Super-X G2)...
by ELECMI | Aug 11, 2020 | EQUIPMENTS, Unique Equipment, LMA - Zaragoza
The Analytical Titan has a spherical aberration corrector (CEOS Company) at the condenser lens, the lens that forms the probe. The Analytical Titan has a spherical aberration corrector (CEOS Company) at the condenser lens, the lens that forms the probe. Consequently,...
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