NEOARM 30-200kV cFEG

NEOARM 30-200kV cFEG

Electron Microscope JEM ARM200cF The JEOL JEM ARM200cF located at the National Centre for Electron Microscopy (CNME) is unique in Spain. This microscope features make it particularly suitable to study structural, chemical and electronic properties of materials at...
SCIOS2

SCIOS2

High throughput Dual Beam (Ar+ ions and electrons) FIB-FEGSEM station for SEM characterization of materials and life-science samples (including secondary, backscattered and STEM imaging; XEDS microanalysis and EBSD), TEM/STEM sample preparation from bulk...
Image Corrected Titan

Image Corrected Titan

The Image Corrected Titan has a spherical aberration corrector (CEOS Company) at the objective lens, the lens that forms the image. It is therefore the ideal instrument for ultra-high resolution imaging (HRTEM). This microscope also has a biprism for Electron...
TALOS F200X

TALOS F200X

High throughput TEM/STEM microscope for the structural and compositional analysis of samples at the angstrom resolution level. It can be operated at 200 and 80 kV. Equipped with a high brightness Field Emission Gun (XFEG); high efficiency XEDS system (Super-X G2)...