JEM ARM200CF: WITH CORRECTED ABERRATION IN CONDENSED LENS
The JEM-ARM200CF is an electron microscope with atomic resolution capability working in TEM or STEM mode with acceleration voltages of 80-200 kV. It has a Cold Field Emission Gun (CFEG) and a CEOS spherical aberration corrector for the STEM mode, allowing the obtaining of images with resolutions up to 78 pm.
The microscope has coupled detectors for chemical analysis using XEDS (energydispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy) with spectral resolution of 0.3eV. This complements the techniques of bright field and dark field (BF / DF) and Z contrast (HAADF) imaging techniques.
What can be done with it?
- Study and structural characterization of materials (catalytic, semiconductors, alloys, mesoporous materials, polymers, biological samples, etc.).
- Obtaining of ultra-high resolution images working in STEM mode.
- Morphological and size information (TEM).
- Chemical mapping (STEM).
- Semi-quantitative compositional analysis (XEDS).
- Quantitative compositional analysis (EELS).
Technical specifications
- Acceleration voltage: 80 – 200 kV.
- Cold FEG gun.
- Spatial resolution: 0.078 nm (STEM mode at 200kV).
- Operating voltage: 80 , 100 and 200 kV.
- CCD camera: 2K x 2K.
- XEDS model OXFORD INCA.
- Energy resolution: 0.3 eV.
- 5 detectors: 3 annular dark field and 2 bright field. Simultaneous acquisition of HAADF, BF and ABF images.
- Beryllium double and single tilt goniometer from GATAN.
- Cooling holder GATAN.
