JSM 6510

JSM 6510

JSM 6510 Scanning Electron Microscope (thermionic) SEM JSM-6510 (JEOL) USES OF THE EQUIPMENT High resolution high vacuum microscopy Microscopic characterization of materials Qualitative microanalysis of solid materials Observation and microanalysis of frozen hydrated...
SPECS JT – STM

SPECS JT – STM

This scanning tunnelling microscope (STM) features a base temperature of 1.2 K and an axial magnetic field of 3 Tesla. At LMA, we have implemented the option of spin-polarized STM which allows us to image simultaneously the magnetic moment and the topography with...
AAHRUS VT-SPM

AAHRUS VT-SPM

AAHRUS SPECS VT-SPM The Aahrus is a combined STM and non-contact AFM head which operates a KolibriTM sensor under Ultra-high-vacuum conditions (P<10-10 mbar). Apart from allowing for imaging of metallic and insulating samples with atomic resolution, its unique...
OMICRON LTQPLUS

OMICRON LTQPLUS

OMICRON LTQPLUS This instrument combines the techniques of atomic force microscopy (AFM) with that of scanning tunneling microscopy (STM) in Ultra-High-Vacuum (UHV) conditions ranging from 300 K to 5K. It is extremely versatile and stable, allowing high-resolution...