FESEM JSM 7100-F with EDS
Field Emission Scanning Electron Microscope FESEM JSM 7100 F (JEOL)
USES OF THE EQUIPMENT
- High-resolution high vacuum microscopy
- Microscopic characterization of materials
- Qualitative microanalysis of solid materials
TECHNICAL SPECIFICATIONS
- Pentafex-INCA EDS Detector (Oxford Instruments)
- E-T secondary electron detector (on camera)
- Backscattered electron detector (on camera)
- Cathode luminescence spectrometer (MONOCL4 Gatan)
