JSM 6510
Scanning Electron Microscope (thermionic) SEM JSM-6510 (JEOL)
USES OF THE EQUIPMENT
- High resolution high vacuum microscopy
- Microscopic characterization of materials
- Qualitative microanalysis of solid materials
- Observation and microanalysis of frozen hydrated samples
TECHNICAL SPECIFICATIONS
- Pentafex-INCA EDS Detector (Oxford Instruments)
- E-T secondary electron detector (on camera)
- Backscattered electron detector (on camera)
- Freezing unit (Cryo-SEM) ALTO1000 Gatan
