JEM 2100

The JEM2100 microscope is a versatile tool that allows characterizing a wide range of samples both from Materials Science and Life Sciences. Morphological and structural information can be obtained in imaging mode (HRTEM) as well as from diffraction (SAED or PED) and chemical composition can be mapped using XEDS spectroscopy.

USES OF THE EQUIPMENT

Morphological characterization of samples both from Materials Science and Life Sciences
Structural characterization of crystalline materials (HRTEM, SAED, PED)
Chemical mapping (STEM-EDX)
Crystal orientation and phase mapping (ASTAR)
Strain mapping (TOPSPIN)

TECHNICAL SPECIFICATIONS

Accelerating voltage: 120 kV – 200 kV
Thermionic emission LaB6 filament
CCD camera: Gatan ORIUS SC1000A
STEM unit with bright field (BF) and high angle annular dark field (HAADF) detectors
XEDS microanalysis system (Oxford Instruments)
Electron beam precession system (DIGISTAR)
Phase and crystal orientation mapping system (ASTAR)
Crystal strain mapping system (TOPSPIN)
JEOL tomography holder (±70o)
Nanofactory TEM-STM holder for in situ electrical measurements