Ubicación:Location: lma - zaragoza
The Quanta FEG-250 SEM instrument is an environmental Scanning Electron Microscope used for high-resolution imaging and composition analysis by energy-dispersive X-ray microanalysis (EDS).
The FEG column in Quanta 250 allows beam deceleration, which permits to achieve a resolution of 1.4 nm even at 1 kV electron landing voltage. The Quanta equipment can work under three different pressure ranges, the maximum pressure being 2600 Pa. This permits observation of life-sciences samples without previous metallic coating, i.e., studies in environmental conditions (ESEM).
This microscope allows the use of a Wet-STEM, which permits to analyze samples with controlled humidity and temperature, which is crucial in life-science samples. The SEM-Quanta can also use a heater to perform observations on samples heated up to 1000 ºC and detect changes in the morphology of the material. In addition, with this microscope de-acceleration of the electron beam over non-conductive samples can be performed leading to 1.4 nm resolution even at 1 kV.
What can be done with it?
Image / Analysis
- By using the different SEM Detectors with which this instrument is equipped, the following information can be obtained:
- Image with secondary electrons-Topography: using an ETD/FLD (Everhart-Thornley Detector/ Large Field) detector for secondary electrons.
- Image (back scattered electrons) and composition by using GAD/vCD (Gaseous Analytical Detector/Low voltage High Contrast) detector.
- Images with secondary electrons from the gas phase by using a GSED/GAD (Gaseous Secondary Electron Detector/Gaseous Analytical) detector, for secondary electrons from the gas phase.
- Elemental chemical analysis by means of Energy-dispersive X-ray spectroscopy (EDX).
- STEM (scanning-transmission) Images by using a Scanning Transmission Electron Microscopy detector.
In situ experiments
- Heatting stage: annealing of the sample up to 1000 ºC with observation using a secondary electron detector.
- Peltier stage: changes in pressure, temperature and relative humidity of the chamber observing the sample using secondary electron or back-scattered electron detectors.
- Wet-STEM y STEM: Scanning Transmission Electron Microscopy in wet mode and also at high vacuum with dried samples.
Bulk materials, films, coatings, and compacted powders either conductive or non-conductive can be studied.
Samples compatible with high vacuum, low vacuum and ESEM mode conditions.
Sample can have a diameter from less than 1 mm up to 5 cm for high and low vacuum. ESEM (environmental SEM) observations require small samples (5 mm).
- VACUUM (modes)
- NAVIGATION & LARGE IMAGES