SEM and Dual Beam

Ubicación:Location: cnme - madrid

Without technician: 20€ /Hour<br> With technician: 30€ /Hour
Without technician: 40€ /Hour<br> With technician: 60€ /Hour
Without technician: 40€ /Hour<br> With technician: 60€ /Hour
Without technician: 80€ /Hour<br> With technician: 120€ /Hour
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The scanning electron microscope JSM 6335F is especially suitable for surface nano-characterization of biological samples and materials, as well as for the semi-quantitative determination of the composition of geological materials and other natures. By using backscattered electrons, a first impression of the distribution of elements and phases can be obtained in the study of materials. 

 

What can be done with it?

  • Obtaining of high-resolution imaging with secondary electrons.
  • Obtaining of backscattered electron images and composition using a BSED detector.
  • Elemental chemical analysis using EDS spectroscopy.

  

Technical specifications

  • Field Emission gun
  • SEI detector
    • 15 kV: 1.5 nm  (WD 4 mm) resolution.
    • 1 kV: 5.0 nm (WD 4 mm) resolution.
  • Magnification
    • 10x to 500.000x
  • BE detector
    • 30 kV: 2 nm  (WD 8 mm) resolution.
  • EDS system