SEM and Dual Beam

Ubicación:Location: cnme - madrid

Without technician: 25€ /Hour<br> With technician: 35€ /Hour
Without technician: 50€ /Hour<br> With technician: 70€ /Hour
Without technician: 50€ /Hour<br> With technician: 70€ /Hour
Without technician: 100€ /Hour<br> With technician: 140€ /Hour
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The JSM 7600F is a scanning electron microscope that combines ultra-high resolution imaging with optimized analytical functionality. In addition, the microscope allows the visualization of samples up to 200 mm in diameter and it has a great variety of detectors for secondary electrons, backscattered electrons, EDS, WDS, BSED, CL, etc.EDS, WDS, EBSD, CL, etc.

 

What can can be done with it?

  • Obtaining of high-resolution images with secondary electrons.
  • Obtaining of backscattered electron images and composition using a BSED detector.
  • Elemental chemical analysis using EDS spectroscopy.

 

Technical specifications

  • SSEI resolution:
    • 1.0 nm (15 kV)
    • 1.5 nm (1 kV) in GB mode
    • 2.5 nm (1 kV) in SEM mode
  • Magnification:
    • 25 to 1,000,000x (on the image size 120mm x 90mm)
  • Accelerating voltage:
    • 0.1 to 30 kV
  • Beam current:
    • 1 pA to 200 nA at 15 kV
  • Aperture angle control lens integrated
  • Detector Upper and lower detectors integrated
  • Energy Filter New r‐filter integrated
  • Gentle beam Integrated
  • Digital images:
    • 1,280 x 960 pixels
    • 2,560 x 1,920 pixels
    • 5,120 x 3,840 pixels