AFM is a surface measurement technique that is based on the interaction of a tip with the surface of the sample. This technique allows the surface analysis of samples with nanometric or even atomic resolution. As a main advantage has the possibility of making measurements without any previous treatment of the sample to be measured, and without the need to use vacuum.

What can be done with it?

  • Topography in contact mode, air and liquid (measures of surface roughness, height of layers, steps, terraces or the shape or distribution of objects on the surface).
  • Topography in tapping mode, in air and in liquid, with the corresponding phase image (measures of the compositional contrast of different materials).
  • Mechanical measures, both in contact and tapping, and in air or liquids (obtaining deflection-displacement curves).
  • Measurements of surface potential to detect the presence of loads on the surface of the sample.
  • Measures of magnetic forces (MFM) that allow to observe magnetic domains that are not visible in the topographical mode.
  • Electrical force measurements (EFM) on the surface of the sample.
  • Nanoindentation and nanoscratching measures to obtain information about the hardness of a sample or the adhesion and durability of a film.

Especificaciones técnicas:

  • Multimode AFM Nanoscope III A (Bruker) equipped with three 1 μ, 15 μ and 150 μ scanners.
  • Temperature controller (measured between ambient temperature and 60ºC).