The Integrated Infrastructure for Electron Microscopy of Materials, ELECMI, is a Unique Scientific and Technical Infrastructure (ICTS) within the current Map of National Facilities in Spain, which is composed of 29 ICTS that bring together a total of 59 facilities. ELECMI is composed of two facilities, the CNME (National Center for Electron Microscopy) that belongs to the University Complutense of Madrid and the LMA (Advanced Microscopy Laboratory) that belongs to the University of Zaragoza.
ICTS refers to facilities, resources or services for the development of top-quality cutting-edge research, as well as the communication, exchange and preservation of knowledge, the transfer of technology and promotion of innovation. ELECMI as well as other ICTS have these three fundamental characteristics:
- Infrastructure with public ownership.
- Unique, meaning that it is the only one of its kind in the country.
- Open to competitive access by users in the entire research community (public and private sectors from any nationality).
It is therefore the aim of ELECMI to provide competitive access to our instruments along with support and sound advice based on the technical skills and expertise from our specialist team.
CNME ELECMI - National Center for Electron Microscopy
The National Center for Electron Microscopy, CNME, the main transversal action of the Campus of International Excellence, Moncloa, is designed according to the study carried out by FECYT on Unique Scientific and Technological Facilities (ICTS) to develop, implement and offer the scientific community, national and international, the most advanced methods and techniques in Transmission and Scanning Electron Microscopy for the structural analysis of materials. This Center consists of a set of last generation microscopes, and instruments and techniques for the advanced preparation of samples, as well as for the application of computational methods of image processing.
LMA ELECMI - Advanced Microscopy Laboratory
The Advanced Microscopy Laboratory, LMA, is a unique initiative at national and international levels aimed at providing the Industrial and Scientific communities with the most advanced infrastructures in Nanofabrication, Local Probe and Electron Microscopies for the observation, characterization, nanopatterning and handling of materials at atomic and molecular scale.
ELECMI has a wide range of top level equipment in Electron and Local Probe Microscopy dedicated to the observation, analysis and characterization of materials at atomic and molecular scale, constituting a large infrastructure at the service of researchers, universities, research centers and Industry, with the ability to address the most relevant challenges in the field of new materials.
The most relevant techniques available at ELECMI ICTS are the following:
Transmission Electron Microscopy - TEM.
Scanning Electron Microscopy - SEM.
Dual Beam Microscopy - DUAL BEAM.
X-Ray Photoelectron Spectroscopy- XPS.
X-Ray High Resolution Diffractometry - XRD.
Scanning Probe Microscopy - STM & AFM.